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Volumn 182, Issue 3-4, 2001, Pages 357-360

Scattering potential for interface roughness scattering

Author keywords

AlAs GaAs; Electron mobility; Ga 0.5 In 0.5 P GaAs; Interface roughness; Scattering potential

Indexed keywords

EIGENVALUES AND EIGENFUNCTIONS; ELECTRON MOBILITY; SCATTERING; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SURFACE ROUGHNESS;

EID: 0035935521     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00448-2     Document Type: Article
Times cited : (7)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.