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Volumn 182, Issue 3-4, 2001, Pages 357-360
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Scattering potential for interface roughness scattering
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Author keywords
AlAs GaAs; Electron mobility; Ga 0.5 In 0.5 P GaAs; Interface roughness; Scattering potential
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Indexed keywords
EIGENVALUES AND EIGENFUNCTIONS;
ELECTRON MOBILITY;
SCATTERING;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING GALLIUM ARSENIDE;
SURFACE ROUGHNESS;
INTERFACE ROUGHNESS;
SCATTERING POTENTIAL;
INTERFACES (MATERIALS);
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EID: 0035935521
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(01)00448-2 Document Type: Article |
Times cited : (7)
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References (15)
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