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Volumn 115, Issue 8, 2001, Pages 3804-3813

Molecular dynamics and microstructure development during cold crystallization in poly(ether-ether-ketone) as revealed by real time dielectric and x-ray methods

(6) Nogales, A a Ezquerra, T A a Denchev, Z a Sics I a Balta Calleja F J a Hsiao, Benjamin S b

a INSTITUTO DE ESTRUCTURA DE LA MATERIA (Spain)

b STONY BROOK UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CORRELATION METHODS; CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; DIELECTRIC RELAXATION; INTEGRAL EQUATIONS; MATHEMATICAL TRANSFORMATIONS; MOLECULAR DYNAMICS; MORPHOLOGY; SPECTROSCOPY; X RAY SCATTERING;

COLD CRYSTALLIZATION; DIELECTRIC SPECTROSCOPY; LAMELLAR STACKS; SMALL ANGLE X RAY SCATTERING ANALYSIS; WIDE ANGLE X RAY SCATTERING ANALYSIS;

POLYETHER ETHER KETONES;

EID: 0035934249 PISSN: 00219606 EISSN: None Source Type: Journal
DOI: 10.1063/1.1388627 Document Type: Article

Times cited : (61)

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