SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 396, Issue 1-2, 2001, Pages 103-108

Surface morphology of C60 polycrystalline films from physical vapor deposition

(4) Chen, Reui San a Lin, Yi Jie a Su, Yu Ching a Chiu, Kuan Cheng a

a CHUNG YUAN CHRISTIAN UNIVERSITY (Taiwan)

Author keywords

Fullerite films; Growth mechanism; PVD; Surface morphology

Indexed keywords

BONDING; CRYSTAL ORIENTATION; FULLERENES; GRAIN SIZE AND SHAPE; PHYSICAL VAPOR DEPOSITION; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SUPERSATURATION; SURFACES; X RAY DIFFRACTION ANALYSIS;

BONDING ENERGY; POLYCRYSTALLINE FILMS; THERMAL ENERGY;

THIN FILMS;

EID: 0035928995 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(01)01256-1 Document Type: Article

Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.