On the problem of M2 analysis using Shack-Hartmann measurements

Journal of Physics D: Applied Physics

Volumn 34, Issue 16, 2001, Pages 2414-2419

  Neubert, Bert John ^a   Huber, Günter ^a   Scharfe, Wolf Dieter ^b  

^a Institut fur Laser Physik   (Germany)

^b ROFIN SINAR LASER GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; IRRADIATION; LASER BEAMS; TRANSMISSION ELECTRON MICROSCOPY;

TIMES-DIFFRACTION-LIMIT NUMBERS;

SENSORS;

EID: 0035928620     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/34/16/305     Document Type: Article

References (12)

1. Wavefront estimation at low light levels
2. Optimal Hartmann sensing at low light levels
3. Hartmann and other screen tests
4. Evaluating the effect of transmissive optic thermal lensing on laser beam quality with a Shack-Hartmann wavefront sensor
5. Shack-Hartmann sensor for fast infrared wavefront testing
6. Absolute sphericity measurement: A comparative study of the use of interferometry and a Shack-Hartmann sensor
7. New developments in laser resonators
8. Amplitude and phase beam characterization using a two dimensional wavefront sensor
9. On the different definitions of laser beam moments
10. Beam propagation and the ABCD ray matrices