PLS photoemission electron microscopy beamline

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 467-468, Issue , 2001, Pages 581-585

  Kang, Tai Hee ^a,b   Kim, Ki jeong ^a   Hwang, C C ^a   Rah, S ^a   Park, C Y ^b   Kim, Bongsoo ^a  

^a POSTECH   (South Korea)

^b Sungkyunkwan University   (South Korea)

Author keywords

Beamline; PEEM; Soft X rays; Synchrotron; Varied line spacing grating

Indexed keywords

DIFFRACTION GRATINGS; ELECTRON MICROSCOPY; MAGNETIC FLUX; MONOCHROMATORS; PHOTOEMISSION; X RAY PHOTOELECTRON SPECTROSCOPY;

VARIED LINE SPACING GRATINGS;

SYNCHROTRONS;

EID: 0035928276     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00417-X     Document Type: Conference Paper

References (16)