The instrumental broadening function of the Bartels five-crystal x-ray diffractometer

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 52, Issue 2, 1996, Pages 245-250

  Healey, P D ^a   Ayers, J E ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001544210     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767395013742     Document Type: Article

References (12)

1. Ayers, J. E. (1990). Dissertation. Rensselaer Polytechnic Institute, Troy, NY, USA.
2. Ayers, J. E. (1994). J. Cryst. Growth, 135, 71-77.
3. Ayers, J. E. & Ladell, J. (1988). Phys. Rev. Lett. A37, 2404-2407.
4. Bartels, W. J. (1983a). J. Vac. Sci. Technol. B1, 338-345.
5. Bartels, W. J. (1983b). Philips Tech. Rev. 41, 183-185.
6. Bearden, J. A. & Shaw, C. H. (1935). Phys. Rev. 48, 18-30.
7. Beaumont, J. H. & Hart, M. (1974). J. Phys. E, 7, 823-829.
8. Berger, H. (1986). X-ray Specirom. 15, 241-243.
9. DuMond, J. W. M. (1937). Phys. Rev. 52, 872-883.
10. Möller, M. O. (1994). J. Appl. Cryst. 27, 369-378.
11. Sluis, P. van der (1994). J. Appl. Cryst. 27, 50-55.
12. Slusky, S. E. G. & Macrander, A. T. (1987). J. Appl. Cryst. 20, 522-528.