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Volumn 34, Issue 10 SPEC. ISS. A, 2001, Pages

X-ray studies on self-organized wires in SiGe/Si multilayers

(10) Roch, T a Holy V b Daniel, A a Hoflinger E a Meduna M b Metzger, T H c Bauer, G a Zhu, J d Brunner, K d Abstreiter, G d

a JOHANNES KEPLER UNIVERSITY LINZ (Austria)

b MASARYK UNIVERSITY (Czech Republic)

c EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

d WALTER SCHOTTKY INSTITUT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; MOLECULAR BEAM EPITAXY; SEMICONDUCTING SILICON; SEMICONDUCTOR QUANTUM DOTS; SEMICONDUCTOR QUANTUM WIRES; SUBSTRATES; X RAY DIFFRACTION; X RAY SCATTERING;

GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING (GISAXS); HETEROINTERFACES;

MULTILAYERS;

EID: 0035926599 PISSN: 00223727 EISSN: None Source Type: Journal
DOI: 10.1088/0022-3727/34/10a/302 Document Type: Article

Times cited : (10)

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