Temporal phase evaluation by fourier analysis of fringe patterns with spatial carrier

Journal of Modern Optics

Volumn 48, Issue 14, 2001, Pages 2129-2139

  Quiroga, J A ^a   Gomez Pedrero J A ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; ERROR COMPENSATION; FOURIER TRANSFORMS; INTERFEROMETRY; IRRADIATION; LIGHT MEASUREMENT; OPTICAL INSTRUMENT LENSES; OPTIMIZATION; SEMICONDUCTOR LASERS; SENSITIVITY ANALYSIS;

DEFLECTOMETRY; FRINGE PATTERNS; IRRADIANCE FLUCTUATIONS; OPTHALMIC LENSES; SPATIAL CARRIER; TEMPORAL PHASE EVALUATION;

MOIRE FRINGES;

EID: 0035923943     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500340108235503     Document Type: Article

References (11)

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