Time-resolved X-ray diffraction study of C60 at high pressure and temperature

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 287, Issue 1-2, 2001, Pages 143-151

  Horikawa, Takashi ^a   Suito, Kaichi ^a   Kobayashi, Michihiro ^a   Onodera, Akifumi ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Fullerene; High pressure; X ray diffraction

Indexed keywords

FULLERENES;

ADDITIONAL EXPERIMENTS; ENERGY DISPERSIVE X-RAY DIFFRACTIONS; HIGH PRESSURE; HIGH TEMPERATURE; HIGH-PRESSURE AND TEMPERATURES; SUPERHARD MATERIAL; TEMPERATURE DEPENDENCIES; TIME RESOLVED X-RAY DIFFRACTIONS;

X RAY DIFFRACTION;

CARBON; FULLERENE DERIVATIVE;

ARTICLE; ATMOSPHERIC PRESSURE; HIGH TEMPERATURE PROCEDURES; RADIATION SCATTERING; RAMAN SPECTROMETRY; TEMPERATURE DEPENDENCE; X RAY DIFFRACTION;

EID: 0035920981     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0375-9601(01)00345-0     Document Type: Article

References (22)