In situ diffraction measurement of the polymerization of C60 at high temperatures and pressures

Journal of Physics Condensed Matter

Volumn 12, Issue 28, 2000, Pages

  Bennington, S M ^a   Kitamura, N ^b   Cain, M G ^c   Lewis, M H ^d   Wood, R A ^d   Fukumi, A K ^b   Funakoshi, K ^e  

^a RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^b Osaka National Research Laboratory   (Japan)

^c NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^d UNIVERSITY OF WARWICK   (United Kingdom)

^e JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISPERSIVE SPECTROSCOPY; HIGH PRESSURE EFFECTS; HIGH TEMPERATURE EFFECTS; PHASE DIAGRAMS; PHASE TRANSITIONS; POLYMERIZATION; X RAY DIFFRACTION ANALYSIS; CONDENSATION; FULLERENES; HIGH TEMPERATURE SUPERCONDUCTORS; LIQUID METALS; MOLECULAR DYNAMICS; ORGANIC SUPERCONDUCTING MATERIALS; OXIDE SUPERCONDUCTORS; PERCOLATION (FLUIDS); SECOND HARMONIC GENERATION; SEMICONDUCTOR METAL BOUNDARIES; STATISTICAL MECHANICS; SUPERFLUID HELIUM;

IN SITU DIFFRACTION MEASUREMENTS; BOSE-EINSTEIN CONDENSATION (BEC); DENSITY FUNCTIONAL THEORY (DFT); EIREV; ELECTRON-PHONON COUPLING; FULDE-FERRELL-LARKIN-OVCHINNIKOV (FFLO) STATE; HALL COEFFICIENT; SHADOW WAVE FUNCTIONS; SURFACE STATIC STRUCTURE FACTOR; THERMAL VIBRATIONS; UNIVERSALITY CLASS;

FULLERENES; MATERIALS SCIENCE;

EID: 0034226648     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/12/28/101     Document Type: Article

References (13)

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