Atomic force microscopy for low-adhesion surfaces: Thermodynamic criteria, critical surface tension, and intermolecular forces

Langmuir

Volumn 17, Issue 6, 2001, Pages 1905-1912

  Frank, Brian P ^a   Belfort, Georges ^a  

^a Rensselaer Polytechnic Institute   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERMOLECULAR FORCES;

ATOMIC FORCE MICROSCOPY; POLYMERS; SURFACE TENSION; THERMODYNAMICS; WETTING;

ADHESION;

EID: 0035917254     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0011533     Document Type: Article

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