Operational amplifier input stage robust to EMI

Electronics Letters

Volumn 37, Issue 15, 2001, Pages 930-931

  Fiori, F ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC IMPEDANCE; ELECTRIC POTENTIAL; ELECTROMAGNETIC WAVE INTERFERENCE; HARMONIC ANALYSIS; SIGNAL DISTORTION; SIGNAL INTERFERENCE; TRANSCONDUCTANCE; TRANSISTORS;

OFFSET VOLTAGE;

OPERATIONAL AMPLIFIERS;

EID: 0035913081     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20010651     Document Type: Article

References (7)

1. New macromodel and measurements for the analysis of EMI effects in 741 opamp circuit
2. Modified Gummel and Poon model for susceptibility prediction
3. Criteria to reduce failures from conveyed electromagnetic interference on CMOS operational amplifiers
4. Prediction of RF interference in operational amplifier by a new analytical model