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Volumn 78, Issue 12, 2001, Pages 1781-1783

Structured doping with light forces

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EID: 0035911465     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1355664     Document Type: Article
Times cited : (27)

References (18)
  • 1
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    • G. Timp, R, E. Behringer, D. M. Tennant, J. E. Cunningham, M. Prentiss, and K. K. Berggren, Phys. Rev. Lett. 69, 1636 (1992); J. J. McClelland, R. E. Scholten, E. C. Palm, and R. J. Celotta, Science 262, 877 (1993).
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    • McClelland, J.J.1    Scholten, R.E.2    Palm, E.C.3    Celotta, R.J.4
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    • R. Gupta, J. J. McClelland, Z. J. Jabbour, and R. J. Celotta, Appl. Phys. Lett. 67, 1378 (1995); U. Drodofsky, J. Stuhler, Th. Schulze, M. Drewsen, B. Brezger, T. Pfau, and J. Mlynek, Appl. Phys. B: Lasers Opt. 65, 755 (1997); B. Brezger, Th. Schulze, P. O. Schmidt, R. Mertens, T. Pfau, and J. Mlynek, Europhys. Lett. 46, 148 (1999).
    • (1995) Appl. Phys. Lett. , vol.67 , pp. 1378
    • Gupta, R.1    McClelland, J.J.2    Jabbour, Z.J.3    Celotta, R.J.4
  • 8
    • 0033560183 scopus 로고    scopus 로고
    • R. Gupta, J. J. McClelland, Z. J. Jabbour, and R. J. Celotta, Appl. Phys. Lett. 67, 1378 (1995); U. Drodofsky, J. Stuhler, Th. Schulze, M. Drewsen, B. Brezger, T. Pfau, and J. Mlynek, Appl. Phys. B: Lasers Opt. 65, 755 (1997); B. Brezger, Th. Schulze, P. O. Schmidt, R. Mertens, T. Pfau, and J. Mlynek, Europhys. Lett. 46, 148 (1999).
    • (1999) Europhys. Lett. , vol.46 , pp. 148
    • Brezger, B.1    Schulze, Th.2    Schmidt, P.O.3    Mertens, R.4    Pfau, T.5    Mlynek, J.6
  • 9
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    • note
    • A Gaussian laser beam with a waist of 100 μm and a power of 20 mW is used. In the direction along the atomic beam, this Gaussian profile is cut in the center by the substrate.
  • 12
    • 0040571224 scopus 로고    scopus 로고
    • note
    • These measurements have been performed with a high-resolution scanning electron microscope (ABT DS 150F, Topcon, Tokyo) in cooperation with Professor Dr. R. Wurster at the Institut für Physik, Universität Hohenheim.
  • 13
    • 0041165448 scopus 로고    scopus 로고
    • note
    • These measurements have been performed with a high-performance scanning Auger electron spectrometer (Perkin-Elmer F-Sonde 680) by Dr. E. Nold at the Institut für Materialforschung, Forschungszentrum Karlsruhe.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.