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0041165456
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note
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A Gaussian laser beam with a waist of 100 μm and a power of 20 mW is used. In the direction along the atomic beam, this Gaussian profile is cut in the center by the substrate.
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12
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0040571224
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note
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These measurements have been performed with a high-resolution scanning electron microscope (ABT DS 150F, Topcon, Tokyo) in cooperation with Professor Dr. R. Wurster at the Institut für Physik, Universität Hohenheim.
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13
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0041165448
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note
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These measurements have been performed with a high-performance scanning Auger electron spectrometer (Perkin-Elmer F-Sonde 680) by Dr. E. Nold at the Institut für Materialforschung, Forschungszentrum Karlsruhe.
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14
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0032537772
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