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Thin Solid Films

Volumn 401, Issue 1-2, 2001, Pages 145-149

Structural and optical characterization of nanocrystals of the InAs-InP system embedded in amorphous SiO2 thin films

(4) Zheng, M J a Zhang, L D a Yang, L a Li, G H a

a INSTITUTE OF SOLID STATE PHYSICS (China)

Author keywords

InAsxP1 x; Sputtering; Structural and Optical properties

Indexed keywords

ENERGY GAP; FILM PREPARATION; LIGHT ABSORPTION; MAGNETRON SPUTTERING; PHONONS; QUANTUM THEORY; RAMAN SCATTERING; SEMICONDUCTING INDIUM PHOSPHIDE; SILICA; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

NANOCRYSTALS;

NANOSTRUCTURED MATERIALS;

EID: 0035904901 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(01)01633-9 Document Type: Article

Times cited : (3)

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