Structural transformations of ultra-thin sputtered Pd activator layers on glass and SnO2 surfaces

Thin Solid Films

Volumn 391, Issue 2, 2001, Pages 209-215

  Mizsei, J ^a   Voutilainen, J ^b   Saukko, S ^b   Lantto, V ^b  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

^b UNIVERSITY OF OULU   (Finland)

Author keywords

Agglomeration; Gas sensor; Nanolayer; Palladium; Tin dioxide

Indexed keywords

AGGLOMERATION; ANNEALING; ATOMIC FORCE MICROSCOPY; CAPACITORS; CHEMICAL ACTIVATION; ELECTRIC RESISTANCE MEASUREMENT; PALLADIUM; SEMICONDUCTING GLASS; SEMICONDUCTING TIN COMPOUNDS; SPUTTER DEPOSITION; ULTRATHIN FILMS; X RAY DIFFRACTION ANALYSIS;

KELVIN PROBE;

CHEMICAL SENSORS;

EID: 0035898910     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)00984-1     Document Type: Conference Paper

References (8)