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Volumn 65, Issue 1, 2000, Pages 195-198

Nanocatalyst sensitizers by agglomeration of nanofilms

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; AGGLOMERATION; AMORPHOUS FILMS; CRYSTALLIZATION; DESORPTION; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRONIC STRUCTURE; SEMICONDUCTING FILMS; SEMICONDUCTING TIN COMPOUNDS; SEMICONDUCTOR DEVICES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034733322     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-4005(99)00296-8     Document Type: Article
Times cited : (16)

References (5)
  • 1
    • 0002355675 scopus 로고
    • Oxidic semiconductor gas sensors
    • in: G. Sberveglieri (Ed.) Kluwer, Dortrecht
    • D. Kohl, Oxidic semiconductor gas sensors, in: G. Sberveglieri (Ed.), Gas Sensors, Kluwer, Dortrecht, 1992, pp. 43-88.
    • (1992) Gas Sensors , pp. 43-88
    • Kohl, D.1
  • 2
    • 0000439827 scopus 로고
    • 2 thick films
    • in: G. Sberveglieri (Ed.) Kluwer, Dortrecht
    • 2 thick films, in: G. Sberveglieri (Ed.), Gas Sensors, Kluwer, Dortrecht, 1992, pp. 117-167.
    • (1992) Gas Sensors , pp. 117-167
    • Lantto, V.1
  • 4
    • 0027680902 scopus 로고
    • 2 layers by metal particles from ultrathin metal films
    • 2 layers by metal particles from ultrathin metal films. Sens. Actuators. B15/B16:1993;328-333.
    • (1993) Sens. Actuators , vol.1516 , pp. 328-333
    • Mizsei, J.1
  • 5
    • 0007038475 scopus 로고
    • Temperature coefficients of resistance of metallic films in the temperature range 25° to 600°C
    • Belser R.B., Hicklin W.H. Temperature coefficients of resistance of metallic films in the temperature range 25° to 600°C. J. Appl. Phys. 30:1959;313-322.
    • (1959) J. Appl. Phys. , vol.30 , pp. 313-322
    • Belser, R.B.1    Hicklin, W.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.