AES depth profiling multilayers of 3d transition metals

Applied Surface Science

Volumn 179, Issue 1-4, 2001, Pages 25-29

  Baunack, S ^a   Menzel, S ^a   Bruckner W ^a   Elefant, D ^a  

^a IFW DRESDEN   (Germany)

Author keywords

AES; Giant magnetoresistance; Sputter induced effects; Thin film; Transition metals

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; GIANT MAGNETORESISTANCE; MULTILAYERS; SURFACE ROUGHNESS;

SPIN-VALVE STRUCTURES; SPUTTER INDUCED EFFECTS;

MAGNETIC THIN FILMS;

EID: 0035898864     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00258-6     Document Type: Article

References (9)