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Volumn 13, Issue 28, 2001, Pages
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Aluminium oxide ultrathin-film growth on the Mo(110) surface: A work-function study
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Author keywords
[No Author keywords available]
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
ELECTRONIC DENSITY OF STATES;
EVAPORATION;
FILM GROWTH;
LOW ENERGY ELECTRON DIFFRACTION;
MOLYBDENUM;
MONOLAYERS;
MULTILAYERS;
SURFACE STRUCTURE;
THERMAL EFFECTS;
ULTRATHIN FILMS;
ANDERSON METHOD;
HEXAGONAL SUPERSTRUCTURE;
THERMAL EVAPORATION;
ULTRATHIN FILM GROWTH;
WORK FUNCTION MEASUREMENT;
ALUMINA;
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EID: 0035898481
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/13/28/101 Document Type: Letter |
Times cited : (15)
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References (17)
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