Wavelet-based approach for ball grid array (BGA) substrate conduct paths inspection

International Journal of Production Research

Volumn 39, Issue 18, 2001, Pages 4281-4299

  Yeh, Chi Hao ^a   Tsai, Du Ming ^b  

^a Van Nan Institute of Technology   (Taiwan)

^b YUAN ZE UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER VISION; DEFECTS; EIGENVALUES AND EIGENFUNCTIONS; INSPECTION; MATRIX ALGEBRA; SUBSTRATES; WAVELET TRANSFORMS;

BALL GRID ARRAY SUBSTRATE; BOUNDARY DEFECTS; TANGENT ANGLES;

PRINTED CIRCUIT TESTING;

EID: 0035895122     PISSN: 00207543     EISSN: None     Source Type: Journal    
DOI: 10.1080/00207540110049737     Document Type: Article

References (25)

1. Bruce, A. and Gao, H. Y., 1996, Applied Wavelet Analysis with S-PLUS (New York: Springer).
2. Chandler, N. and Tyler, S. G., 1995, Ultra-fine feature printed circuits and multi-chip modules. Microelectronic Journal, 26, 393-404.
3. Chen, G. Y. and Bui, T. D., 1999, Invariant Fourier-wavelet descriptor for pattern recognition. Pattern Recognition, 32, 1083-1087.
4. Chui, C. K., 1992, An Introduction to Wavelets (Boston, MA: Academic Press).
5. Cootes, T. F., Page, G. J., Jackson, C. B. and Taylor, C. J., 1996, Statistical grey-level models for object location and identification. Image and Vision Computing, 14, 533-540.
6. Daubechies, I., 1990, The wavelets transforms time-frequency localization and signal analysis. IEEE Transaction on Information Theory, 36, 961-1005.
7. Daubechies, I., 1992, Ten Lectures on Wavelets (Philadelphia, PA: SIAM).
8. Fairhurst, M. C., 1998, Computer Vision for Robotic Systems: an Introduction (Englewood Cliffs, NJ: Prentice Hall).
9. Foster, J. W. III, Griffin, P. M., Villalobos, J. R. and Messimer, S. L. 1990, Automated visual inspection of bare printed circuit boards. Computer and Industry Engineering, 18, 505-509.
10. Hara, Y., Akiyama, N. and Karasaki, K., 1983, Automatic inspection system for printed circuit boards. IEEE Transactions on Pattern Analysis and Machine Intelligence, 5, 623-630.
11. Lee, B. Y. and Tarng, Y. S., 1999, Application of the discrete wavelet transform to the monitoring of tool failure in end milling using the spindle motor current. International Journal of Advanced Manufacturing Technology, 15, 238-243.
12. Lee, J. S., Sun, Y. N. and Tsai, C. T., 1993, Wavelet based corner detection. Pattern Recognition, 26, 853-865.
13. Lee, J. S., Sun, Y. N. and Tsai, C. T., 1995, Multiscale corner detection by using wavelet transformation. IEEE Transactions on Image Processing, 4, 100-104.
14. Mandeville, J. R., 1985, Novel method for analysis of printed circuit images. IBM Journal Research and Development, 29, 73-87.
15. Mogant, M. and Ercal, F., 1996, Automatic PCB inspection algorithms: a survey. Computer Vision and Image Understanding, 63, 287-313.
16. Mogant, M. and Ercal, F., 1998a, Segmentation of printed circuit board images into basic patterns. Computer Vision and Image Understanding, 70, 74-86.
17. Mogant, M. and Ercal, F., 1998b, A subpattern level inspection system for printed circuit board. Computer Vision and Image Understanding, 70, 51-62.
18. Pavlidis, T., 1978, Minimum storage boundary tracing algorithm and its application to automatic inspection. IEEE Transactions on Systems, Man, and Cybernetic, 8, 66-69.
19. Perera, U. D., 1999, Evaluation of reliability of μBGA solder joints through twisting and bending. Microelectronic Reliability, 39, 391-399.
20. Quddus, A. and Fahmy, M. M., 1999, Fast wavelet-based corner detection technique. Electronic Letters, 35.
21. Sterling, W. M., 1979, Automatic non-reference inspection of printed wiring boards. Proceedings of the IEEE Computer Society Conference Pattern Recognition and Image Processing, August, pp. 93-100.
22. Tsai, D. M., Hou, H. T. and Su, H. J., 1999, Boundary-based corner detection using eigen-values of covariance matrices. Pattern Recognition Letters, 20, 31-40.
23. Tsunekawa, H., 1992, Latest image evaluation systems aid efforts for product quality. Journal of Electronic Engineering, 29, 72-77.
24. West, G. A. W., 1984, A system for the automatic visual inspection of bare-printed circuit boards. IEEE Transactions on Systems, Man, and Cybernetic, 14, 767-773.
25. Wu, W. Y., Wang, M. J. and Liu, C. M., 1996, Automated inspection of printed circuit boards through machine vision. Computers in Industry, 28, 103-111.