메뉴 건너뛰기




Volumn 90, Issue 10, 2001, Pages 5032-5037

Channeling on boron clusters in silicon

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0035890735     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1406968     Document Type: Article
Times cited : (3)

References (14)
  • 6
    • 0039182341 scopus 로고    scopus 로고
    • Ph.D. thesis, Eindhoven University of Technology
    • P. W. L. Van Dijk, Ph.D. thesis, Eindhoven University of Technology, 1997.
    • (1997)
    • Van Dijk, P.W.L.1
  • 7
    • 0040366812 scopus 로고    scopus 로고
    • Proceedings of the fourth international workshop on measurement, characterization and modeling of ultra-shallow doping profiles in semiconductors
    • A. Agarwal, H. Gossmann, D. J. Eaglesham, D. C. Jacobson, T. E. Haynes, J. Jackson, Yu. E. Erokhin, and J. M. Poate, Proceedings of the Fourth International Workshop on Measurement, Characterization and Modeling of Ultra-Shallow Doping Profiles in Semiconductors [Appl. Mater. 49, 1 (1997)].
    • (1997) Appl. Mater. , vol.49 , pp. 1
    • Agarwal, A.1    Gossmann, H.2    Eaglesham, D.J.3    Jacobson, D.C.4    Haynes, T.E.5    Jackson, J.6    Erokhin, Yu.E.7    Poate, J.M.8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.