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Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 12, 2001, Pages 1252011-1252016

Major stable surface of silicon: Si(20 4 23)

(6) Gai, Zheng a,b Zhao, R G a Li, Wenjie a Fujikawa, Y b Sakurai, T b Yang, W S a

a PEKING UNIVERSITY (China)

b TOHOKU UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; ELECTRON DIFFRACTION; ELECTRON TRANSPORT; IMAGE ANALYSIS; MOLECULAR STABILITY; SCANNING TUNNELING MICROSCOPY; STRUCTURE ANALYSIS; SURFACE PROPERTY; TECHNOLOGY;

EID: 0035883616 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (29)

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