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Volumn 64, Issue 12, 2001, Pages

Defect Auger exciton dissociation and impact ionization in conjugated polymers

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; AUGER ELECTRON SPECTROSCOPY; CONJUGATION; DISSOCIATION; ELECTRIC FIELD; EXCITATION; IONIZATION; OXIDATION; POLYMERIZATION; PROBABILITY; RADIATION SCATTERING; SYSTEM ANALYSIS; THEORY; THERMAL ANALYSIS;

EID: 0035883447     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.64.125202     Document Type: Article
Times cited : (6)

References (15)
  • 6
    • 85038966010 scopus 로고    scopus 로고
    • V. Abakumov, V. Perel, and I. Yassievich, (North-Holland, Amsterdam, 1991), p. 227
    • V. Abakumov, V. Perel, and I. Yassievich, Nonradiative Recombination in Semiconductors (North-Holland, Amsterdam, 1991), p. 227.
  • 7
    • 4243307304 scopus 로고    scopus 로고
    • The values of the intrachain dielectric constant (formula presented), the on-site Coulomb repulsion energy, and the exchange factor (formula presented) in Table. I are obtained by fitting our results of single configuration interaction calculation with the first principle calculations by, on the lowest and second lowest singlet and triplet exciton energies
    • The values of the intrachain dielectric constant (formula presented), the on-site Coulomb repulsion energy U and the exchange factor (formula presented) in Table. I are obtained by fitting our results of single configuration interaction calculation with the first principle calculations by Rohlfing [Phys. Rev. Lett.82, 1959 (1999)] on the lowest and second lowest singlet and triplet exciton energies.
    • (1999) Phys. Rev. Lett. , vol.82 , pp. 1959


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.