Visibility measurement with an X-ray interferometer using a coincidence technique

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 40, Issue 6 B, 2001, Pages

  Yabashi, Makina ^a   Tamasaku, Kenji ^a,b   Ishikawa, Tetsuya ^a,b  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b SPring 8/RIKEN ^*  (Japan)

Author keywords

Coherent X ray optics; Coincidence technique; Synchrotron radiation; Visibility; X ray interferometer

Indexed keywords

INTERFEROMETERS; SYNCHROTRON RADIATION; X RAY OPTICS;

INTERFERENCE BEAMS; X-RAY INTERFEROMETERS;

VISIBILITY;

EID: 0035874860     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.l646     Document Type: Article

References (9)