Dendrimer-mediated growth of very flat ultrathin Au films

Applied Surface Science

Volumn 175-176, Issue , 2001, Pages 134-139

  Rar, A ^a   Zhou, J N ^a   Liu, W J ^a   Barnard, J A ^b   Bennett, A ^a   Street, S C ^a  

^a UNIVERSITY OF ALABAMA   (United States)

^b University of Alabama   (United States)

Author keywords

Au; Dendrimer; Metal organic interface; Surface hardness; Thin films; XPS

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; DENDRIMERS; FILM GROWTH; GOLD; INTERFACES (MATERIALS); SELF ASSEMBLY; SILICA; SILICON WAFERS; SURFACE ROUGHNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

FILM QUALITY; METAL ORGANIC INTERFACE; SURFACE HARDNESS;

ULTRATHIN FILMS;

EID: 0035873523     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00055-1     Document Type: Article

References (16)

1. Baker L.A., Zamborini F.P., Sun L., Crooks R.M. Anal. Chem. 71:1999;4403.
2. Tomalia D.A., Naylor A.M., Goddard W.A. Angew. Chem. Int. Ed. Engl. 26:1990;138.
3. Frechet J.M. J. Sci. 263:1994;1710.
4. Zhou R., Rar A., Otte D., Barnard J.A. J. Appl. Phys. 88:2000;1880.
5. Technical Information, Dendritech Inc., Midland, MI.
6. Hierlemann A., Campbell J.K., Baker L.A., Crooks R.M., Ricco A.J. J. Am. Chem. Soc. 120:1998;5323.
7. Tsukruk V.T., Rinderspacher F., Bliznyuk V.N. Langmuir. 13:1997;2171.
8. Parratt L.G. Phys. Rev. 95:1954;359.
9. de Boer D.K.G. Phys. Rev. B. 44:1991;498.
10. Oliver W.C., Pharr G.M. J. Mater. Res. 7:1992;1564.
11. Tanuma S., Powell C.J., Penn D.R. Surf. Interface Anal. 17:1991;927.
12. Tokuhisa H., Zhao M., Baker L., Phan V.T., Dermody D.L., Garcia M.E., Peez R.F., Crooks R.M., Mayer T.M. J. Am. Chem. Soc. 120:1998;4492.
13. Herdt G.C., Czanderna A.W. J. Vac. Sci. Technol. A16:1999;3415.
14. D.R. Jung, A.W. Czanderna, G.C. Herdt, in: K.L. Mittal, K.-W. Lee (Eds.), Polymer Surfaces and Interfaces: Characterization, Modification, and Application, VSP, Utrecht, Netherlands, 1997, p. 189.
15. Handbook of X-ray Photoelectron Spec., J.F. Moulder, W.F. Stickle, P.E. Sobol, K.D. Bomben (Eds.), Phys. Electronics Inc., 1995.
16. P.M.A. Sherwood, in: D. Briggs, M.P. Seah (Eds.), Practical Surface Analysis, 2nd Edition, Vol. 1, Wiley, UK, 1983, p. 555.