메뉴 건너뛰기




Volumn 353, Issue 3-4, 2001, Pages 251-257

Transmission electron microscopy investigation of Bi-2223/Ag tapes

Author keywords

Bi 2223; Grain size; Intergrowth; Texture; Transmission electron microscopy

Indexed keywords

ANNEALING; BISMUTH COMPOUNDS; CRYSTAL MICROSTRUCTURE; GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; MORPHOLOGY; SUPERCONDUCTING TAPES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0035872718     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(00)01755-X     Document Type: Article
Times cited : (13)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.