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Volumn 353, Issue 3-4, 2001, Pages 251-257
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Transmission electron microscopy investigation of Bi-2223/Ag tapes
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Author keywords
Bi 2223; Grain size; Intergrowth; Texture; Transmission electron microscopy
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Indexed keywords
ANNEALING;
BISMUTH COMPOUNDS;
CRYSTAL MICROSTRUCTURE;
GRAIN BOUNDARIES;
HIGH RESOLUTION ELECTRON MICROSCOPY;
MORPHOLOGY;
SUPERCONDUCTING TAPES;
TRANSMISSION ELECTRON MICROSCOPY;
INTERGROWTH;
OXIDE SUPERCONDUCTORS;
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EID: 0035872718
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4534(00)01755-X Document Type: Article |
Times cited : (13)
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References (16)
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