In situ measurements of texture and phase development in (Bi,Pb)2Sr2Ca2Cu3O10-Ag tapes

Journal of Materials Research

Volumn 12, Issue 4, 1997, Pages 891-905

  Thurston, T R ^a   Haldar, P ^b   Wang, Y L ^a   Suenaga, M ^a   Jisrawi, N M ^a,c   Wildgruber, U ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b Intermagnetics General Corporation   (United States)

^c BIRZEIT UNIVERSITY   (Palestine)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH TEMPERATURE EFFECTS; HIGH TEMPERATURE SUPERCONDUCTORS; OXIDE SUPERCONDUCTORS; SILVER; SYNCHROTRON RADIATION; TAPES; TEXTURES; X RAY DIFFRACTION ANALYSIS;

TEXTURE/PHASE DEVELOPMENT MEASUREMENT;

SUPERCONDUCTING DEVICES;

EID: 0031120452     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1997.0129     Document Type: Article

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