Study of the surface resistance of Niobium sputter-coated Copper cavities

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 1, 1999, Pages 900-903

  Benvenuti, C ^a   Calatroni, S ^a   Campisi, I E ^a,b   Darriulat, P ^a   Peck, M A ^a   Russo, R ^a   Valente, A M ^a  

^a CERN   (Switzerland)

^b THOMAS JEFFERSON NATIONAL ACCELERATOR FACILITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; ELECTRIC RESISTANCE; MAGNETIC FLUX; MATHEMATICAL MODELS; NIOBIUM; SCANNING ELECTRON MICROSCOPY; SPUTTERING; SURFACES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CRITICAL TEMPERATURE; NIOBIUM FILM; PENETRATION DEPTH; SURFACE RESISTANCE; TRAPPED MAGNETIC FLUX;

SUPERCONDUCTING FILMS;

EID: 0032645955     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783442     Document Type: Article

References (7)

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