X-ray microanalysis of organic thin sections in TEM using an UTW Si(Li) detector: Comparison of quantification methods

Microscopy Research and Technique

Volumn 52, Issue 2, 2001, Pages 231-238

  Laquerriere, Patrice ^a,c   Banchet, Vincent ^a   Michel, Jean ^a   Zierold, Karl ^b   Balossier, Gérard ^a   Bonhomme, Pierre ^a  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

^b MAX PLANCK INSTITUTE OF MOLECULAR PHYSIOLOGY   (Germany)

^c NONE   (France)

Author keywords

Biological thin section; K factors; Low Z elements; Quantification methods; X ray microanalysis

Indexed keywords

CHEMICAL ELEMENTS; ELECTRON PROBE MICROANALYSIS; X RAY DETECTORS;

BIOLOGICAL THIN SECTION; K FACTOR; LIGHT ELEMENTS; LOW Z-ELEMENTS; ORGANICS; PEAK RATIOS; QUANTIFICATION METHODS; RATIO METHOD; THIN-SECTIONS; X-RAY MICROANALYSIS;

X RAY SPECTROMETERS;

ARTICLE; ELECTRON MICROSCOPY; FILTER; INTERMETHOD COMPARISON; MICROANALYSIS; PRIORITY JOURNAL; SCANNING TRANSMISSION ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

EID: 0035863109     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/1097-0029(20010115)52:2<231::AID-JEMT1008>3.0.CO;2-F     Document Type: Article

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