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Journal of Colloid and Interface Science

Volumn 233, Issue 2, 2001, Pages 295-305

Ellipsometry and infrared reflection absorption spectroscopy of adsorbed layers of soluble surfactants at the air-water interface

(3) Walsh, Christopher B a Wen, Xinyun a Franses, Elias I a

a PURDUE UNIVERSITY (United States)

Author keywords

Cationic surfactants; Ellipsometry; Gemini surfactants; Reflection absorption spectroscopy

Indexed keywords

ABSORPTION SPECTROSCOPY; ALGORITHMS; ELLIPSOMETRY; MICROSTRUCTURE; SURFACE TENSION;

SURFACE DENSITIES;

SURFACE ACTIVE AGENTS;

ARGININE METHYL ESTER; CARBENE; N ALPHA LAUROYLARGININE METHYL ESTER; N ALPHA,N OMEGA BIS(N ALPHA LAUROYLARGININE) ALPHA,OMEGA DIAMIDE; SOLVENT; SURFACTANT; UNCLASSIFIED DRUG; WATER;

ABSORPTION SPECTROSCOPY; ADSORPTION; ALGORITHM; ARTICLE; CONCENTRATION (PARAMETERS); DENSITY; ELLIPSOMETRY; FILM; INFRARED SPECTROSCOPY; MOLECULAR MODEL; PRIORITY JOURNAL; SURFACE PROPERTY; SURFACE TENSION; THICKNESS;

EID: 0035862302 PISSN: 00219797 EISSN: None Source Type: Journal
DOI: 10.1006/jcis.2000.7275 Document Type: Article

Times cited : (26)

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