메뉴 건너뛰기




Volumn 37, Issue 8, 2001, Pages 533-534

Optimisation for improved short-channel performance of surrounding/cylindrical gate MOSFETs

Author keywords

[No Author keywords available]

Indexed keywords

GATES (TRANSISTOR); INTEGRATED CIRCUIT LAYOUT; MATHEMATICAL MODELS; OPTIMIZATION; POISSON EQUATION; THIN FILMS; ULSI CIRCUITS;

EID: 0035848734     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20010340     Document Type: Article
Times cited : (12)

References (5)
  • 1
    • 0026896303 scopus 로고
    • Scaling the Si MOSFET: From bulk to SOI to bulk
    • YAN, R.H., QURMAZD, A., and LEE, K.F.: 'Scaling the Si MOSFET: from bulk to SOI to bulk', IEEE Trans. Electron Devices, 1992, 39, (7), pp. 1704-1710
    • (1992) IEEE Trans. Electron Devices , vol.39 , Issue.7 , pp. 1704-1710
    • Yan, R.H.1    Qurmazd, A.2    Lee, K.F.3
  • 3
    • 0031079417 scopus 로고    scopus 로고
    • Scaling theory for cylindrical fully-depleted, surrounding gate MOSFETs
    • AUTH, C.P., and PLUMMER, J.D.: 'Scaling theory for cylindrical fully-depleted, surrounding gate MOSFETs', IEEE Electron Device Lett., 1997, 18, (2), pp. 74-76
    • (1997) IEEE Electron Device Lett. , vol.18 , Issue.2 , pp. 74-76
    • Auth, C.P.1    Plummer, J.D.2
  • 4
    • 0020194040 scopus 로고
    • Short channel MOST threshold voltage model
    • RATNAKUMAR, K.N., and MEINDL, J.D.: 'Short channel MOST threshold voltage model', IEEE J. Solid-State Circuits, 1982, 17, (5), pp. 937-947
    • (1982) IEEE J. Solid-state Circuits , vol.17 , Issue.5 , pp. 937-947
    • Ratnakumar, K.N.1    Meindl, J.D.2
  • 5
    • 0031192554 scopus 로고    scopus 로고
    • An analytical steady-state current-voltage characteristics of short channel fully depleted surrounding gate transistor (FD-SGT)
    • ENDOH, T., NAKAMURA, T., and MASUOKA, F.: 'An analytical steady-state current-voltage characteristics of short channel fully depleted surrounding gate transistor (FD-SGT)', IEICE Trans. Electron., 1997, E80-C, (7), pp. 911-917
    • (1997) IEICE Trans. Electron. , vol.E80-C , Issue.7 , pp. 911-917
    • Endoh, T.1    Nakamura, T.2    Masuoka, F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.