Measurement of optical properties of highly doped silicon by terahertz time domain reflection spectroscopy

Applied Physics Letters

Volumn 79, Issue 24, 2001, Pages 3923-3925

  Nashima, S ^a   Morikawa, O ^a   Takata, K ^a   Hangyo, M ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035842788     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1413498     Document Type: Article

References (10)

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