Growth of thin Co films on W(1 1 0) and Au(1 1 1) layers prepared on Al2O3(1 1 2̄ 0)

Surface Science

Volumn 495, Issue 1-2, 2001, Pages 185-194

  Sellmann, R ^a   Fritzsche, H ^a   Maletta, H ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Aluminum oxide; Auger electron spectroscopy; Cobalt; Epitaxy; Gold; Low energy electron diffraction (LEED); Surface structure, morphology, roughness, and topography; Tungsten

Indexed keywords

ALUMINA; AUGER ELECTRON SPECTROSCOPY; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; SINGLE CRYSTALS; SURFACE ROUGHNESS; THIN FILMS; TOPOLOGY;

COBALT FILMS;

METALLIC FILMS;

EID: 0035842113     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01569-2     Document Type: Article

References (29)

1. Tribology series