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Volumn 317, Issue 1-2, 1998, Pages 310-313
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Growth, structure, and magnetism of W and Fe/W thin films on Al2O3
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Author keywords
Magnetization; Temperature; Thickness
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Indexed keywords
ALUMINA;
AUGER ELECTRON SPECTROSCOPY;
CRYSTAL ORIENTATION;
CRYSTAL STRUCTURE;
ELECTRON BEAMS;
EPITAXIAL GROWTH;
EVAPORATION;
IRON;
LOW ENERGY ELECTRON DIFFRACTION;
MAGNETIC VARIABLES MEASUREMENT;
MAGNETISM;
TUNGSTEN;
ELECTRON BEAM EVAPORATION;
SQUID MAGNETOMETRY;
MAGNETIC THIN FILMS;
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EID: 0032049244
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(97)00546-4 Document Type: Article |
Times cited : (5)
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References (16)
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