Oxygen-induced stress-modified reconstructions of the Ta(1 1 0)/Al2O3(1 1- 20) surface: A surface X-ray diffraction study

Surface Science

Volumn 492, Issue 1-2, 2001, Pages 41-54

  Robach, O ^a,b   Robinson, I K ^b   Durfee, C S ^b   Wiemeyer, B W ^b   Flynn, C P ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b University of Illinois at Urbana Champaign   (United States)

Author keywords

Aluminum oxide; Metallic films; Oxidation; Surface relaxation and reconstruction; Surface stress; Surface structure, Morphology, roughness, and topography; Tantalum; X ray scattering, diffraction, and reflection

Indexed keywords

ANISOTROPY; CRYSTAL ATOMIC STRUCTURE; CRYSTAL GROWTH; CRYSTAL ORIENTATION; LATTICE CONSTANTS; METALLIC FILMS; MOLECULAR BEAM EPITAXY; OXYGEN; SAPPHIRE; SINGLE CRYSTALS; SURFACE TREATMENT; TANTALUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

SUPERSTRUCTURE RODS;

SURFACE STRUCTURE;

EID: 0035840972     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01394-2     Document Type: Article

References (27)