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Volumn 79, Issue 11, 2001, Pages 1611-1613
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Evidence for strain-induced lateral carrier confinement in InGaAs quantum wells by low-temperature near-field spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0035839826
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1402638 Document Type: Article |
Times cited : (10)
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References (13)
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