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Volumn 79, Issue 15, 2001, Pages 2468-2470
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Scanning tunneling microscopic study of boron-doped silicon nanowires
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0035828609
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1409276 Document Type: Article |
Times cited : (78)
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References (11)
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