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Volumn 13, Issue 31, 2001, Pages 6865-6874

An electronic structure study of c-axis oriented NdBCO (123) thin films using polarized soft x-ray absorption spectroscopy on Cu L3 and O K edges

(12) Singhal, R K a Dalela, S a Chaturvedi, D a Dalela, B a Saini, N L b Sekhar, B R c Garg, K B a Beaumount, V d Mercey, B d Chen, C T e Lin, Hong Ji e Huo, T Y e

a UNIVERSITY OF RAJASTHAN (India)

b INFM (Italy)

c INSTITUTE OF PHYSICS (India)

d LABORATOIRE CRISMAT (France)

e NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ELECTRONIC STRUCTURE; MAGNETIC SUSCEPTIBILITY; MAGNETIC VARIABLES MEASUREMENT; NEODYMIUM COMPOUNDS; SUPERCONDUCTIVITY; X RAY DIFFRACTION ANALYSIS;

MAGNETIC SUSCEPTIBILITY MEASUREMENT; POLARIZED X RAY ABSORPTION SPECTROSCOPIC MEASUREMENT; SUPERCONDUCTING THIN FILMS;

SUPERCONDUCTING FILMS;

EID: 0035817059 PISSN: 09538984 EISSN: None Source Type: Journal
DOI: 10.1088/0953-8984/13/31/320 Document Type: Article

Times cited : (4)

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