A polarized x-ray absorption spectroscopy study of O K and Cu L3 edges in a Tl(2212) thin film

Journal of Physics Condensed Matter

Volumn 10, Issue 15, 1998, Pages 3417-3425

  Srivastava, P ^a,b   Sekhar, B R ^a,b   Gasser, C ^a   Studer, F ^a   Garg, K B ^b   Chen, C T ^c   Pompa, M ^d  

^a UNIVERSITÉ DE CAEN   (France)

^b UNIVERSITY OF RAJASTHAN   (India)

^c NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^d UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001656923     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/10/15/017     Document Type: Article

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