SCOPUS 정보 검색 플랫폼

Analytica Chimica Acta

Volumn 442, Issue 2, 2001, Pages 183-190

Desorption-ionization on silicon mass spectrometry: An application in forensics

(4) Thomas, John J a Shen, Zhouxin b Blackledge, Robert c Siuzdak, Gary a

a SCRIPPS RESEARCH INSTITUTE (United States)

b UNIVERSITY OF CALIFORNIA (United States)

c LAC+USC Medical Center (United States)

Author keywords

Desorption ionization; DIOS; Forensic science; Mass spectrometry; Polymers

Indexed keywords

POLYMER; SILICON;

ACCURACY; ANALYTIC METHOD; ARTICLE; CHEMICAL ANALYSIS; CRIMINAL BEHAVIOR; DESORPTION; FORENSIC IDENTIFICATION; IONIZATION; LASER; MASS SPECTROMETRY; MOLECULAR WEIGHT; POROSITY; PRIORITY JOURNAL; SURFACE PROPERTY;

EID: 0035812430 PISSN: 00032670 EISSN: None Source Type: Journal
DOI: 10.1016/S0003-2670(01)01107-2 Document Type: Article

Times cited : (77)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.