Experimental evidence for dislocation core structures in silicon

Scripta Materialia

Volumn 45, Issue 11, 2001, Pages 1273-1278

  Spence, John ^a   Koch, Christoph ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Dislocation core structure; Electron diffraction; Reconstruction; STEM

Indexed keywords

CONTINUUM MECHANICS; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DEEP LEVEL TRANSIENT SPECTROSCOPY; DISLOCATIONS (CRYSTALS); ELECTRON DIFFRACTION; ELECTRON SPIN RESONANCE SPECTROSCOPY; SHEAR STRESS; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY; YIELD STRESS;

BRAGG DIFFRACTION EFFECTS; CONTINUUM ELASTICITY;

SEMICONDUCTING SILICON;

EID: 0035802567     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(01)01161-7     Document Type: Article

References (18)