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Volumn 395, Issue 1-2, 2001, Pages 66-70
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Hot-wire CVD growth simulation for thickness uniformity
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Author keywords
Chemical vapor deposition; Computer simulation; Solar cells; Thickness uniformity
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
COMPUTER SIMULATION;
FILM GROWTH;
SUBSTRATES;
THICKNESS CONTROL;
THICKNESS UNIFORMITY;
THIN FILMS;
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EID: 0035801048
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(01)01209-3 Document Type: Conference Paper |
Times cited : (8)
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References (5)
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