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Volumn 391, Issue 1, 2001, Pages 21-27

Correlation between magnetoresistive properties and growth morphology of La1-xMnO3-δ thin films deposited on SrTiO3, LaAlO3 and MgO

(6) Pignard, S a Yu Zhang, K b Leprince Wang, Y b Han, K c Vincent, H a Senateur J P a

a LABORATOIRE DES MATÉRIAUX ET DU GÉNIE PHYSIQUE (France)

b National Centre of Scientific Research (France)

c FLORIDA STATE UNIVERSITY (United States)

Author keywords

Electrical properties and measurements (112); Interfaces (212); Magnetic properties and measurements (282); Transmission electron microscopy (496)

Indexed keywords

COLOSSAL MAGNETORESISTANCE; CRYSTALLIZATION; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; FILM GROWTH; HIGH RESOLUTION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); LANTHANUM COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM);

MAGNETIC THIN FILMS;

EID: 0035796944 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(01)00970-1 Document Type: Article

Times cited : (25)

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