Secondary Ion Mass Spectroscopy Study of Oxygen-18 Tracer Diffusion in 2/1-Mullite Single Crystals

Journal of the American Ceramic Society

Volumn 84, Issue 3-12, 2001, Pages 2845-2848

  Fielitz, Peter ^a   Borchardt, Günter ^a   Schmücker, Martin ^b   Schneider, Hartmut ^b   Wiedenbeck, Michael ^c   Rhede, Dieter ^c   Weber, Sylvian ^d   Scherrer, Stanislas ^d  

^a CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

^b GERMAN AEROSPACE CENTER DLR   (Germany)

^c GFZ GERMAN RESEARCH CENTRE FOR GEOSCIENCES   (Germany)

^d UNIVERSITÉ DE LORRAINE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ATOMS; CHEMICAL ACTIVATION; CRYSTAL GROWTH FROM MELT; DIFFUSION IN GASES; ELECTRON TRANSPORT PROPERTIES; ENTROPY; RATE CONSTANTS; SECONDARY ION MASS SPECTROMETRY; SINGLE CRYSTALS; THERMAL EFFECTS; TRACE ANALYSIS;

ACTIVATION ENTHALPY; ACTIVATION ENTROPY; BOLTZMANN CONSTANT; CZORALSKI GROWN MULLITE; MULLITE; SECONDARY ION MASS SPECTROSCOPY; TRACER DIFFUSION;

OXYGEN;

EID: 0035790121     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2001.tb01103.x     Document Type: Article

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