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Volumn 31, Issue 5, 1998, Pages 325-328

NDE of a 3-D surface crack using magnetic field induced by DC current flow

Author keywords

3 D surface crack; DC current; Magnetic field

Indexed keywords

APPROXIMATION THEORY; CRACKS; ELECTRIC CURRENTS; MAGNETIC FIELD MEASUREMENT; MAGNETIC FIELDS; MAGNETIC VARIABLES MEASUREMENT; MATHEMATICAL MODELS; THREE DIMENSIONAL;

EID: 0032186732     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0963-8695(98)00019-X     Document Type: Article
Times cited : (13)

References (7)
  • 1
    • 0347410317 scopus 로고
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    • Dover, W. D. and Bond, L. J., Weld crack characterization on offshore structures using a.c. potential difference and ultrasonics. NDT International, 1986, 19, 243-247.
    • (1986) NDT International , vol.19 , pp. 243-247
    • Dover, W.D.1    Bond, L.J.2
  • 2
    • 0009413337 scopus 로고
    • Thin-skin electromagnetic fields around surface-breaking cracks in metals
    • Lewis, A. M., Michael, D. H., Lugg, M. C. and Collings, R., Thin-skin electromagnetic fields around surface-breaking cracks in metals. J. Appl. Phys., 1988, 64, 3777-3784.
    • (1988) J. Appl. Phys. , vol.64 , pp. 3777-3784
    • Lewis, A.M.1    Michael, D.H.2    Lugg, M.C.3    Collings, R.4
  • 3
    • 0025404374 scopus 로고
    • ACFM - A new NDT technique
    • Lugg, M., ACFM - a new NDT technique. Metals and Materials, 1990, 6, 142-144.
    • (1990) Metals and Materials , vol.6 , pp. 142-144
    • Lugg, M.1
  • 4
    • 0027697308 scopus 로고
    • A focused-field eddy current sensor for non-destructive testing
    • Placko, D. and Dufour, I., A focused-field eddy current sensor for non-destructive testing. IEEE Trans. Magn., 1993, 29, 3192-3194.
    • (1993) IEEE Trans. Magn. , vol.29 , pp. 3192-3194
    • Placko, D.1    Dufour, I.2
  • 5
    • 0029293286 scopus 로고
    • Sizing technique for slots and surface cracks in materials
    • Yeh, C. Y. and Zoughi, R., Sizing technique for slots and surface cracks in materials. Mater. Eval., 1995, 53, 496-501.
    • (1995) Mater. Eval. , vol.53 , pp. 496-501
    • Yeh, C.Y.1    Zoughi, R.2
  • 6
    • 0030145732 scopus 로고    scopus 로고
    • NDE of a crack by using closely coupled probes for DCPD technique
    • Saka, M., Oouchi, A. and Abé, H., NDE of a crack by using closely coupled probes for DCPD technique. Trans. ASME, J. Pres. Vessel Technol., 1996, 118, 198-202.
    • (1996) Trans. ASME, J. Pres. Vessel Technol. , vol.118 , pp. 198-202
    • Saka, M.1    Oouchi, A.2    Abé, H.3
  • 7
    • 0001040154 scopus 로고
    • Detection and analysis of electric-current perturbation caused by defects
    • Beissner, R. E., Teller, C. M., Burkhardt, G. L., Smith, R. T. and Barton, J. R., Detection and analysis of electric-current perturbation caused by defects. ASTM STP, 1981, 722, 428-446.
    • (1981) ASTM STP , vol.722 , pp. 428-446
    • Beissner, R.E.1    Teller, C.M.2    Burkhardt, G.L.3    Smith, R.T.4    Barton, J.R.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.