Emission site control in carbon nanotube field emitters by focused ion beam irradiation

Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC

Volumn , Issue , 2001, Pages 29-30

  Sawada, A ^a   Iriguchi, M ^a   Zhao, W J ^a   Ochiai, C ^a   Takai, M ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; DEFECTS; ELECTRON EMISSION; ELECTROPHORESIS; FIELD EMISSION CATHODES; ION BEAMS; IRRADIATION; PHOTOCURRENTS; THRESHOLD VOLTAGE;

CARBON NANOTUBE FIELD EMITTERS; EMISSION SITES; FOCUSED ION BEAM IRRADIATION;

CARBON NANOTUBES;

EID: 0035784254     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. Y. Chen, D. T. Shaw, L. Guo, Appl. Phys. Lett, 76, 2469 (2000)
2. O. Yavas, C. Ochiai, M. Takai, A. Hosono, and S. Okuda, Appl. Phys. Lett. 76, 3319 (2000)