Triple junction diffusion: Experiments and models

Defect and Diffusion Forum

Volumn , Issue 194-199 PART 2, 2001, Pages 1265-1270

  Peteline, A ^a   Peteline, S ^a   Oreshina, O ^a  

^a NATIONAL UNIVERSITY OF SCIENCE AND TECHNOLOGY MISIS   (Russian Federation)

Author keywords

Concentration Profile; Diffusion; Grain Boundary; Triple Junction

Indexed keywords

ALUMINUM; ANNEALING; GRAIN BOUNDARIES; MICROANALYSIS; ZINC;

TRIPLE JUNCTIONS;

DIFFUSION;

EID: 0035780741     PISSN: 10120386     EISSN: 16629507     Source Type: Journal    
DOI: None     Document Type: Article

References (6)

1. V.B. Rabukhin, A.S. Panikarski, Poverhnost' 5 (1986) 150 [in Russian].
2. L.M. Klinger, L.A. Levin, A.L. Peteline, Defect Diff. Forum 143-147 (1997) 1523-1526.
3. A.L. Peteline, Mater. Sci. Forum 235-238 (1997) 469-474.
4. V.A. Ivanov, A.S. Ostrovsky, A.L. Peteline, S.A. Peteline, Defect Diff. Forum 156 (1998) 223-228.
5. I. Kaur, W. Gust, L. Kozma, Handbookof Grain and Interphase Boundary Diffusion Data, Vol.2, Studtgart, 1993.
6. B.S. Bokstein, Defect Diff. Forum 66-69 (1989) 631-648.