Measurement of spectral response of photocathodes and its application

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4580, Issue , 2001, Pages 486-495

  Qian, YunSheng ^a   Zong, Zhiyuan ^a   Chang, BenKang ^a  

^a NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Electron diffusion length; Measurement; Multi alkali photocathode; NEA photocathode; On line; Spectral response; Surface escape probability

Indexed keywords

LIGHT REFLECTION; MONOCHROMATORS; OPTOELECTRONIC DEVICES; PHOTOCURRENTS; QUANTUM THEORY; SEMICONDUCTING GALLIUM ARSENIDE; SODIUM COMPOUNDS;

BACK-INTERFACE RECOMBINATION VELOCITY; ELECTRON DIFFUSION LENGTH; MONOCHROMATIC PHOTOCURRENT; MULTI-ALKALI PHOTOCATHODE; ON-LINE MEASUREMENT SYSTEM; SPECTRAL RESPONSE; SURFACE ESCAPE PROBABILITY;

PHOTOCATHODES;

EID: 0035777169     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.445002     Document Type: Conference Paper

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