Study on the optical method of measuring the thickness of optical films in the devices

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3558, Issue , 1998, Pages 209-213

  Qian, Yunsheng ^a   Fu, Rongguo ^a   Xu, Denggao ^a   Chang, Benkang ^a  

^a NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE INTENSIFIERS (SOLID STATE); LIGHT REFLECTION; PHOTOCATHODES; THICKNESS MEASUREMENT;

MULTIAKALI PHOTOCATHODES;

OPTICAL FILMS;

EID: 0032307171     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)