A new sensor for remote interferometry

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4596, Issue , 2001, Pages 158-168

  Osten, Wolfgang ^a   Baumbach, Torsten ^a   Jüptner, Werner ^a  

^a BIAS BREMER INSTITUT FÜR ANGEWANDTE STRAHLTECHNIK GMBH   (Germany)

Author keywords

Coherent mask; Digital comparative holography; Remote metrology; Shape control

Indexed keywords

DIGITAL COMMUNICATION SYSTEMS; HOLOGRAMS; HOLOGRAPHIC INTERFEROMETRY; IMAGE RECONSTRUCTION; INSPECTION; MICROSTRUCTURE; QUALITY CONTROL; TELEMETERING;

DIGITAL COMPARATIVE HOLOGRAPHY; REMOTE INTERFEROMETRY;

OPTICAL SENSORS;

EID: 0035773751     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.447338     Document Type: Conference Paper

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