Optical coherence tomography in scattering material for industrial applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4595, Issue , 2001, Pages 223-230

  Alarousu, Erkki ^a   Myllylä, Risto ^a   Gurov, Igor ^b   Hast, Jukka ^a  

^a UNIVERSITY OF OULU   (Finland)

^b ITMO UNIVERSITY   (Russian Federation)

Author keywords

Low coherent interferometer; Optical coherence tomography

Indexed keywords

COHERENT LIGHT; INDUSTRIAL APPLICATIONS; INTERFEROMETERS; LUMINESCENT DEVICES; MEDICAL IMAGING; MULTILAYERS; OPTICAL MULTILAYERS; PLASTICS; SCANNING;

OPTICAL COHERENCE TOMOGRAPHY (OCT);

TOMOGRAPHY;

EID: 0035771570     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.446617     Document Type: Article

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